We have 100 laser diodes. 30 meet the customer's requirement. Green = pass.
Probability of selecting a good diode (Event E): P(E) = 30 / 100 = 0.30
Sample space: S = {a, b, c, d}
Assigned probabilities: P(a)=0.1, P(b)=0.3, P(c)=0.5, P(d)=0.1
Events: A = {a, b}, B = {b, c, d}, C = {d}
A = {a,b}. Add the probabilities of the outcomes inside A: P(a)=0.1 and P(b)=0.3. Because outcomes in S are disjoint and their probabilities add, P(A)=P({a})+P({b})=0.1+0.3=0.4.
B = {b,c,d}. Sum the masses on b, c, d: P(b)=0.3, P(c)=0.5, P(d)=0.1. So P(B)=0.9.
C = {d}. Single outcome d has probability 0.1, therefore P(C)=0.1.
The complement A′ contains everything not in A. From the set readout above, A′={c,d}. In probability, P(A′)=1−P(A) because A and A′ partition S. Since P(A)=0.4, we get 0.6. (You can also check: P(c)+P(d)=0.5+0.1=0.6.)
B′ is everything not in B. From sets: B′={a}. Using the complement rule, P(B′)=1−P(B)=1−0.9=0.1. (Matches P(a)=0.1.)
C={d} so C′={a,b,c}. Complement rule gives 1−P(C)=0.9. Check by addition: P(a)+P(b)+P(c)=0.1+0.3+0.5=0.9.
A∩B means outcomes that are in both A and B. With A={a,b} and B={b,c,d}, the only common element is {b}. Therefore P(A∩B)=P(b)=0.3.
A∪B contains anything in A or in B (or both). Here, A∪B = {a,b} ∪ {b,c,d} = {a,b,c,d} = S. The probability of the whole sample space is 1, so P(A∪B)=1.
Alternate check with inclusion–exclusion: P(A)+P(B)−P(A∩B)=0.4+0.9−0.3=1.0.
A={a,b} and C={d} have no common outcomes, so A∩C=∅. The probability of the empty set is 0: P(∅)=0.
Real-World Setup: A bin has 50 parts: 3 defective, 47 good. Select 6 without replacement.
Goal: Probability that exactly 2 of the 6 parts are defective.
Step-by-step breakdown:
Another case: 0 defectives (all good)?
Takeaway: With only 3 defectives in 50, it’s much more likely your 6 are all good. This is the hypergeometric setting (sampling without replacement).
Other useful rules:
FYI – Advanced Rules: